CIQTEK recently wrapped up an intensive two-day training program at the University of Science and Technology of China (USTC). By combining deep-dive theory with hands-on practice, our team helped nearly 60 researchers …
2026 is a fresh start for CIQTEK Electron Microscope USA operations. This year, we officially formed a dedicated CIQTEK US team. That means more local presence, faster response, and closer communication with customers …
Aluminum alloys, prized for their exceptional strength-to-weight ratio, are ideal materials for automotive lightweighting. Resistance spot welding (RSW) remains the mainstream joining method for automotive body …
CIQTEK has introduced its next-generation 12-inch wafer scanning electron microscope (SEM) solution, designed to meet the demands of advanced semiconductor manufacturing processes. Offering full-wafer inspection without …
CIQTEK is pleased to announce the successful installation and training of the FIBSEM DB550 at our Korean distributor GSEM’s Electron Microscope Center. This milestone marks an important step in expanding access to …
Beyong Nano, a leading innovator in nanotechnology, is set to unveil its groundbreaking model CIQTEK SEM3200 at the prestigious 33rd International Materials Research Congress taking place in Cancun, Mexico. The …
CIQTEK is pleased to announce its participation in the Microscopy Conference 2025 (MC2025), taking place August 31 – September 4 in Karlsruhe, Germany. You can find us at Booth #28 in the exhibition area of Messe …
The Microscopy Society of Canada(MSC-SMC) is excited to host the 2025 51st Meeting in Winnipeg! MSC hosts a series of talks and workshops within the fields of materials, life science, and AI-driven image analysis, …
Professor Yan Yu's team at USTC utilized the CIQTEK Scanning Electron Microscope SEM3200 to study the post-cycling morphology. It developed amorphous carbon with controllable defects as a candidate material for an …
Electron Backscatter Diffraction (EBSD) is a widely used microscopy technique in material science. It analyzes the angles and phase differences of the backscattered electrons produced when a sample interacts with a …