The 15th China Symposium on Electron Paramagnetic Resonance (EPR) Spectroscopy was successfully held at Chongqing University from October 24 to 27, 2025. Nearly one hundred experts, scholars, industry representatives, and graduate students gathered to discuss cutting-edge topics in the EPR field, including new techniques and theories, biological spin labeling, and new energy applications.

Grand Launch: CIQTEK Q-Band EPR Spectrometers Make a Stunning Debut

As a pioneer in paramagnetic resonance technology, CIQTEK officially unveiled its new Q-band EPR spectrometer series — the EPR-Q400 High-Frequency Pulse Spectrometer and the EPR-Q300 Continuous-Wave Spectrometer, marking another significant milestone in high-frequency EPR technology.

Compared with traditional X-band EPR, high-frequency EPR offers:

• Higher spectral resolution

• Stronger orientation selectivity

• Enhanced sensitivity

Making it a powerful tool for biomacromolecular structure studies, spin dynamics research, and materials science applications.

Dr. Richard Shi from CIQTEK Introduces the New Q-Band EPR Instruments at the Meeting

Flagship Model: EPR-Q400 High-Frequency Pulse Spectrometer

The EPR-Q400, the flagship model of this release, supports both CW and pulsed EPR measurements, meeting a wide range of research demands. It enables variable-temperature experiments from 4 K to 300 K, providing flexible and precise experimental conditions.

Notably, the Q-band spectrometer adopts the same software platform as CIQTEK X-band EPR systems, greatly reducing the learning curve and ensuring a seamless and user-friendly operation experience.

Dedicated CW Solution: EPR-Q300 Continuous-Wave Spectrometer

For users focusing solely on continuous-wave EPR experiments, CIQTEK introduced the EPR-Q300, offering a targeted and efficient solution for diverse scientific applications.

Continuous Innovation in EPR Technology

This product launch showcases CIQTEK’s robust R&D capabilities and in-depth technical expertise in EPR spectroscopy, thereby further enriching its EPR product portfolio. During the symposium, multiple experts recognized CIQTEK’s responsive and professional technical support, noting that the team not only helps resolve experimental challenges but also actively participates in collaborative research, contributing to high-level scientific achievements.

Upcoming Event: CIQTEK Paramagnetic Academy 2026

To further promote academic exchange and talent development in EPR technology, the CIQTEK Paramagnetic Academy Advanced EPR Workshop will be held from July 17 to 27, 2026, in conjunction with the CIQTEK EPR User Symposium.

These events will serve as an open platform for technical communication, experience sharing, and application discussions among EPR researchers and users.
Stay tuned for more updates and upcoming event announcements.

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Cutting-edge research platform for micro/nanoscale material behavior studies

The Center for Micro/Nanoscale Behavior of Materials at Xi’an Jiaotong University (XJTU) has established a comprehensive in-situ materials performance research platform based on the CIQTEK SEM4000 Field Emission Scanning Electron Microscope (FE-SEM). By integrating multiple in-situ testing systems, the center has achieved remarkable progress in the application of in-situ SEM techniques and advanced materials science research.

Leading national research infrastructure

The XJTU Center for Micro/Nanoscale Behavior of Materials focuses on the structure–property relationship of materials at the micro/nanoscale. Since its establishment, the center has published over 410 high-impact papers, including in Nature and Science, demonstrating outstanding scientific output.

The center houses one of the most advanced in-situ materials performance research platforms in China, equipped with large-scale systems such as a Hitachi 300 kV environmental TEM with quantitative nanomechanical–thermal coupling capabilities and an environmental aberration-corrected TEM for atomic-scale in-situ studies of thermo-mechanical-gas interactions. Together, these instruments provide powerful technical support for frontier materials research.

Efficient and seamless experience with CIQTEK SEM

In 2024, the center introduced the CIQTEK SEM4000 Field Emission Scanning Electron Microscope.
Dr. Fan Chuanwei, equipment manager at the center, remarked:

“The resolution and stability of the CIQTEK SEM4000 perfectly meet our research demands. What impressed us most was the efficiency. It took less than four months from equipment installation to our first paper published using the system, and the entire process from procurement to operation and after-sales was highly efficient.”

Regarding customized services, Dr. Fan added:

“For our in-situ SEM experiments, CIQTEK tailored a real-time video recording module and designed customized adapter stages for various in-situ setups. The rapid response and flexibility of the CIQTEK team fully demonstrate their professional expertise.”

Integrated in-situ testing capabilities

The SEM4000 platform at XJTU has successfully integrated three core in-situ testing systems, forming a complete in-situ mechanical performance research capability.

• Bruker Hysitron PI 89 Nanomechanical Test System – Enables nanoindentation, tensile, fracture, fatigue, and mechanical property mapping. It has been extensively used in micro/nanoscale mechanical testing of semiconductor devices, leading to significant results in semiconductor materials research.

• KW In-situ Tensile Stage – Offers a loading range from 1 N to 5 kN and supports various grips, including standard compression/tension, compact tension, three-point bending, and fiber tensile testing. Combined with SEM imaging, it allows real-time correlation of mechanical data with microstructural evolution, providing critical insights into deformation mechanisms.

• Custom In-situ Torsion Stage – Developed by Prof. Wei Xueyong’s team at the School of Instrument Science and Engineering, XJTU, this system enables torsional deformation studies under SEM observation, adding a unique capability to the research platform.

CIQTEK Field Emission SEM4000 at Xi'an Jiaotong University

Dr. Fan commented:

“The systems are well integrated with the SEM and easy to operate. Our researchers quickly became proficient, and these combined techniques have provided a wealth of valuable experimental data and scientific discoveries.”

SEM4000: Designed for in-situ excellence

The outstanding performance of SEM4000 in in-situ studies benefits from its purpose-built engineering design. According to CIQTEK engineers, the large chamber and long-travel stage provide ample space and stability for complex in-situ setups, which is a key advantage over conventional SEMs.

Its modular architecture, featuring 16 flange interfaces, allows flexible customization of vacuum ports and electrical feedthroughs for different in-situ devices. This design makes integration and system expansion remarkably straightforward.

In addition, the integrated in-situ video recording function enables continuous observation and recording of microstructural evolution during experiments, providing crucial data for dynamic process analysis and mechanism exploration.

Continuous innovation for future research

Looking ahead, the XJTU center plans several technology development initiatives based on the SEM4000 platform, reflecting strong confidence in the long-term advancement of CIQTEK scientific instruments.

“We plan to add in-situ heating and EBSD modules for high-temperature and EBSD observations. We also aim to extend our self-developed quantitative in-situ mechanical analysis software, which was originally developed for TEM, to SEM applications. Furthermore, we’re developing an ‘SEM AI Agent’ system to enable automated operation, image acquisition, and data processing through AI assistance,” said Dr. Fan.

“With these continuous improvements, we hope to achieve more breakthroughs in understanding micro/nanoscale material behavior while contributing to the progress and broader adoption of advanced domestic scientific instruments. With CIQTEK’s support, we are confident in realizing these goals.”

The collaboration between Xi'an Jiaotong University and CIQTEK demonstrates the strong potential and technological depth of CIQTEK's high-end scientific instruments in frontier research. From the first paper produced within four months to the successful integration of multiple in-situ testing systems, the CIQTEK SEM4000 has proven to be a cornerstone of XJTU’s advanced materials research platform, earning recognition from one of the nation’s leading research institutions.

A research team led by Prof. Haomin Wang from the Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, has achieved significant progress in studying the magnetism of zigzag graphene nanoribbons (zGNRs) using the CIQTEK Scanning NV Microscope (SNVM).

Building on their previous research, the team fabricated oriented atomic grooves in hexagonal boron nitride (hBN) by pre-etching with metal nanoparticles and synthesized chiral-controlled graphene nanoribbons within these grooves through a vapor-phase catalytic CVD method. The resulting ~9 nm-wide zGNRs embedded in the hBN lattice exhibited intrinsic magnetic properties, which were directly confirmed experimentally for the first time using SNVM combined with magnetic transport measurements.

This groundbreaking work lays a solid foundation for developing graphene-based spintronic devices. The study, titled “Signatures of magnetism in zigzag graphene nanoribbons embedded in a hexagonal boron nitride lattice”, was published in the renowned journal Nature Materials.

https://doi.org/10.1038/s41563-025-02317-4

Understanding Graphene Magnetism

Graphene, as a unique two-dimensional material, exhibits p-orbital electron magnetism that differs fundamentally from the localized d/f orbital magnetism found in conventional materials. This distinction opens new directions for exploring carbon-based quantum magnetism. Zigzag graphene nanoribbons (zGNRs) are particularly promising for spintronic applications because of their predicted magnetic electronic states near the Fermi level. However, detecting zGNR magnetism through electrical transport measurements has remained highly challenging.

The main difficulties include the limited length of bottom-up synthesized nanoribbons, which complicates device fabrication, and the chemically reactive edges that lead to instability or inhomogeneous doping. Furthermore, in narrow zGNRs, strong antiferromagnetic coupling between edge states makes it difficult to electrically detect magnetic signals. These challenges have hindered direct observation of intrinsic magnetism in zGNRs.

SNVM Reveals Magnetic Signals at Room Temperature

Embedding zGNRs within an hBN lattice enhances edge stability and introduces built-in electric fields, providing an ideal environment for studying magnetism. Using CIQTEK’s room-temperature SNVM, the researchers directly visualized magnetic signals in zGNRs for the first time under ambient conditions.

Figure 1. Magnetic measurement of zGNRs embedded in a hexagonal boron nitride lattice using the Scanning NV Microscope

In electrical transport measurements, the ~9 nm-wide zGNR transistors demonstrated high conductivity and ballistic transport behavior. Under magnetic fields, the devices showed pronounced anisotropic magnetoresistance, with resistance changes up to 175 Ω and a magnetoresistance ratio of approximately 1.3% at 4 K, which persisted up to 350 K. Magnetic hysteresis appeared only when the magnetic field was applied perpendicular to the zGNR plane, confirming magnetic anisotropy. Analysis of the angular dependence of magnetoresistance indicated that the magnetic moments were oriented normal to the sample surface. The decrease in magnetoresistance with increasing source-drain bias and temperature revealed interactions between magnetic response, charge transport, and thermal vibrations.

By combining SNVM imaging with transport characterization, this study provides the first direct evidence of intrinsic magnetism in zGNRs embedded in hBN and demonstrates the potential for electric-field control of magnetic behavior. This work deepens the understanding of graphene magnetism and opens new opportunities for developing graphene-based spintronic devices.

Experience Nanoscale Magnetic Imaging with CIQTEK SNVM

CIQTEK invites researchers to experience the Scanning NV Microscope (SNVM), a world-leading nanoscale magnetic imaging system featuring a temperature range of 1.8–300 K, a 9/1/1 T vector magnetic field, 10 nm magnetic spatial resolution, and 2 μT/Hz¹ᐟ² magnetic sensitivity.

CIQTEK SNVM: the ambient version and the cryogenic version

The SNVM integrates diamond nitrogen-vacancy (NV) center-based optically detected magnetic resonance (ODMR) with atomic force microscopy (AFM) scanning technology. It offers high spatial resolution, superior magnetic sensitivity, multifunctional detection, and non-invasive imaging capabilities, making it an essential tool for research in magnetic domain characterization, antiferromagnetic imaging, superconductivity studies, and two-dimensional magnetic materials.

Moving from a conventional silicon-based Active Harmonic Filter to one using Silicon Carbide (SiC) MOSFETs represents a major technological leap, and the cooling system is directly impacted.

Here’s a detailed look at the cooling system of a SiC Active Harmonic Filter, highlighting how it differs from traditional IGBT-based AHFs.

The Core Advantage: Why SiC Changes the Game

Silicon Carbide is a wide-bandgap semiconductor with superior material properties compared to silicon. For an AHF, this translates into three key benefits that directly influence thermal management:

1. Higher Switching Frequencies: SiC MOSFETs can switch on and off much faster than IGBTs. This allows for a more accurate reconstruction of the "anti-harmonic" current, improving performance, especially for higher-order harmonics.

2. Lower Switching Losses: The most significant impact for cooling. The rapid switching of SiC devices generates less heat during each transition.

3. Higher Operating Temperatures: SiC semiconductors can theoretically operate at junction temperatures up to 200°C or more, compared to the typical 150°C limit for silicon IGBTs. This provides a higher safety margin.

Impact on the Cooling System

Because of the advantages above, the thermal design of a SiC AHF becomes simpler, more efficient, and more reliable.

1. Reduced Heat Load

The primary effect is that a SiC AHF generates less heat for the same output power. The lower switching and conduction losses mean there is simply less thermal energy that needs to be removed.

Result: The cooling system can be smaller, quieter, and less powerful for the same AHF rating.

2. Cooling Method Evolution

• Forced Air Cooling Becomes More Viable for Higher Power:

  • A 100A SiC AHF might be comfortably air-cooled, whereas a 100A silicon IGBT AHF might be pushing the limits of air cooling, requiring a larger, noisier fan assembly.

  • The reduced heat load means the fans can run slower, leading to quieter operation and longer fan life. The heat sinks can also be smaller.

• Liquid Cooling Becomes More about Power Density than Necessity:

  • For the highest power ratings (e.g., >300A), liquid cooling is still used, but now the driver is often extreme power density.

  • A liquid-cooled SiC AHF can be made significantly more compact than its silicon counterpart because the lower heat flux allows for a smaller liquid cooling plate and heat exchanger.

3. Increased Reliability and Lifetime

Heat is the primary enemy of electronics. By generating less heat and being able to withstand higher temperatures, SiC AHFs experience less thermal stress.

• Electrolytic Capacitors: These components are very sensitive to heat. The cooler internal environment of a SiC AHF significantly extends the lifespan of these critical (and often life-limiting) components.

• Semiconductors: Operating at a lower temperature relative to their maximum rating greatly enhances the long-term reliability of the SiC MOSFETs themselves.

• Fans (in air-cooled units): With a lower thermal load, fans run slower and for shorter durations, increasing their Mean Time Between Failure (MTBF).

Comparison: Silicon IGBT vs. SiC MOSFET AHF Cooling

Practical Implications and Benefits for the User

1. Smaller Footprint: You can get the same harmonic filtering performance from a physically smaller cabinet because the cooling apparatus is less bulky.

2. Higher Efficiency: Less energy is wasted as heat, so the SiC AHF itself consumes less power, improving your overall system efficiency. A typical SiC AHF can be 1-3% more efficient than a silicon one.

3. Reduced Maintenance: With less heat and slower-moving fans (in air-cooled models), the maintenance intervals can be longer. Air filters may not clog as quickly.

4. Reduced Downtime Risk: The higher inherent reliability and thermal ruggedness of the SiC system reduce the risk of unexpected thermal shutdowns or failures.

The adoption of Silicon Carbide technology fundamentally simplifies the cooling challenge in Active Harmonic Filters. While the cooling methods (air vs. liquid) remain the same, the systems are less stressed, more efficient, and more reliable.

When specifying a new AHF, choosing a SiC-based model is not just about better electrical performance; it's also a choice for a more robust, compact, and lower-maintenance system with a longer operational lifespan, largely due to its superior thermal characteristics.

CIQTEK continues to expand its presence in Europe with the establishment of an SEM demo station in Spain, operated by the trusted local distributor IESMAT. Located in Madrid, the demo station features a CIQTEK High-Performance and Universal Tungsten Filament SEM Microscope SEM3200, providing Spanish users with convenient access to live demonstrations, sample testing, and hands-on operation. The facility also offers professional Spanish-language service and technical consultation, helping local customers better understand and apply CIQTEK’s advanced electron microscopy technologies.

Since the installation of the CIQTEK SEM3200, IESMAT has actively organized a series of seminars and workshops throughout 2025, typically held every one to two months. These events welcome researchers and professionals from academia and industry to explore the performance and advantages of CIQTEK scanning electron microscopes through hands-on sessions and interactive learning experiences.

IESMAT SEM Workshop in January 2025

IESMAT SEM Seminar in Feb, 2025

IESMAT Most Recent SEM Seminar in Sep, 2025

The next event, IESMAT Electron Microscopy Day II, will take place on November 6, 2025, in Madrid. Participants will enjoy:

• Live hands-on electron microscopy with the CIQTEK SEM3200

• Cutting-edge analytics using EDS and EBSD

• Insights into current trends and future directions of electron microscopy in Spain

The SEM demo station at IESMAT marks an important milestone in CIQTEK’s European development strategy. It enhances local accessibility to advanced electron microscopy technologies and provides researchers with authentic, real-world experience. Through close collaboration with partners like IESMAT, CIQTEK is deepening its engagement with the European market, promoting innovation, and building stronger connections with the scientific community.

CIQTEK remains committed to empowering global users through advanced instrumentation, localized service, and continuous collaboration for scientific progress.

This week, CIQTEK was pleased to welcome the team from our Korean distributor GSEM to the CIQTEK Electron Microscope Factory in Wuxi, China. The visit included members from sales, application, and service departments, who participated in a series of intensive and professional training sessions focused on electron microscope operation and maintenance.

The CIQTEK Electron Microscope Factory serves as the company’s dedicated manufacturing and training center for electron microscopy systems. Equipped with advanced production facilities, precision assembly lines, and demonstration laboratories, the factory integrates R&D, manufacturing, quality control, and user training to ensure high performance and reliability across CIQTEK SEM, FIB-SEM, and TEM product lines.

The training was hosted by Mr. Gao, Head of the Electron Microscopy Solutions Department at CIQTEK, together with senior engineers from the CIQTEK electron microscopy team. During the program, participants received systematic instruction on key procedures such as ion pump baking, aperture position inspection, filament centering, high-resolution imaging practice, and accessory installation and calibration.

Throughout the week, the GSEM team worked closely with CIQTEK engineers to gain both theoretical and practical understanding of CIQTEK’s electron microscopy technology. The sessions were designed to ensure that GSEM’s sales and service engineers are fully equipped with the technical expertise required to support local customers in Korea, from system installation and operation to advanced troubleshooting and maintenance.

This training not only enhanced GSEM’s technical capabilities but also strengthened the partnership between CIQTEK and GSEM. With continuous collaboration in product knowledge, application support, and customer service, CIQTEK and GSEM will jointly provide more professional, efficient, and reliable solutions to the Korean electron microscopy market.

CIQTEK remains committed to empowering global partners through professional training, technical collaboration, and continuous innovation in scientific instrumentation.

In the world of wearable technology, the Q520 Smart Ring stands out by proving that meaningful health insights don't require bulky devices. Weighing just 4.2 grams with a slim 2.1mm profile, this elegantly designed ring disappears on your finger while working quietly in the background to monitor your wellbeing. Crafted from medical-grade alloy using advanced vacuum plating technology, it combines durability with a sophisticated look that transitions seamlessly from workout sessions to formal occasions.

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